Mintek owns  a  JEOL  JEM-2100F,  Field Emission  Gun (200kV), Transmission Electron Microscope (FEG-TEM) capable  of  providing   high  spatial   resolution,  atomic imaging  and   micro-  and   nano-structure  analysis  of materials.

Our   FEI   Nova    Nano-SEM   200    Field   Emission   High Resolution    Scanning    Electron    Microscope   (HRSEM) enables    both   high    and   very    low   kV    imaging   and analytical   capabilities  of  specimens  in  and  below  lens configuration with  the option to operate  in either high or low vacuum conditions.  It is equipped with an  Everhardt Thornley Detector (EDT), backscattered electron detector (BSED),  through-the-lens  detector (TLD)  for high resolu-tion imaging, as well as  a X-ray spectrometer  (EDXS) for X-ray analysis.

Mintek-NIC    owns   the    Nanoscope   and   Enviroscope multimode  Atomic  Force Microscopes.  Our multi-mode AFMs uses both contact and tapping modes  to analyse samples with the resolution in the nanometer range.The samples   can   be   analysed   under   high   vacuum  and conditions  like  temperature  can  be  altered  whilst  the analysis is performed.